Abstract
Scalar power measurements in the millimeter-wave frequency range and beyond are either performed with rather slow calorimetric devices or zero bias Schottky diode detectors. The latter are used for scattering parameter [1] and direction of arrival measurements [2, 3] utilizing the six-port receiver architecture. Focal plane arrays [4] and holographic imaging systems [5] are further fields of application. Within front end modules of semiconductor ATS and frequency extension modules of signal generators, diode detectors are used for power monitoring of forward and backward travelling waves to realize automatic level control loops and overload protection.
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