Abstract
The most important factors influencing obtaining reliable results of surface structure measurements are presented. The article presents the rules for the selection of an appropriate measurement method adapted to the nature of the measured surface and the advantages, disadvantages and limitations of measuring instruments. Principles of good metrological practice during the preparation of the device for carrying out measurements and performing the analysis in order to calculate the parameters of the of the surface structure were discussed.
Highlights
Condition of geometric structure of the surface is one of the most important factors determining the proper functioning of products, and modern technologies allow for proper shaping of this structure in order to obtain the required properties
PBS2/A6/20/2013 financed by the National Center for Research and Development "Research and assessment of the reliability of modern methods for measuring surface topography at the micro and nano scale”
The paper was financed from a project implemented by Fabryka Łożysk Tocznych – Kraśnik S.A., and financed from the European Union's operational program "Intelligent Development", which utilized the abovementioned results
Summary
Condition of geometric structure of the surface is one of the most important factors determining the proper functioning of products, and modern technologies allow for proper shaping of this structure in order to obtain the required properties. Along with the development of manufacturing technology, there has been a dynamic development of new methods for measuring the geometric structure of the surface and measuring instruments using these methods in recent years These solutions are increasingly used in both industrial practice and scientific research. Necessary element to ensure consistency, reliability and usefulness of measurement is reliable estimation of its uncertainty This requires identifying potential sources of error that will contribute the most to the uncertainty budget. The third criterion is related to the nature of inequalities occurring on the measured surface, which can be described by the amplitude, distance of the inequality or slope inclination In this case, the measurement method should be selected in terms of achievable sampling steps in the OX and OY axes and resolution in the OZ axis. In the case of a group of optical and contact devices, the choice is not so straightforward, because in addition to the possibility of horizontal sampling and resolution in vertical axis, the slope mapping efficiency and mechanical filtration resulting from the mapping blade geometry, are important
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