Abstract
We report on the measurement of nonlinear refraction in ion-doped solids with a method that combines the single-beam Z-scan technique and a Fourier analysis of the transmittance time evolution. The laser beam is modulated at a frequency f and the Fourier components at f and 2f are shown to be related, respectively, to linear and nonlinear refractions. Their ratio is used to eliminate spurious linear effects as a way of increasing the sensitivity of the measurement. With this method we are able to measure nonlinear phase changes of a few tens of mrad, corresponding to wave front distortions smaller than λ/105. Moreover, the technique can discriminate nonlinear processes with different relaxation times.
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