Yield strength at high pressure and temperature

Abstract

Yield strength is measured at high pressure and temperature using a large volume, high pressure apparatus (SAM85) with synchrotron radiation. A macroscopic deviatoric stress is manifest as a uniform deviatoric strain that is oriented by the geometry of the pressurizing medium. Microscopic deviatoric stress is identified as the elastic broadening of diffraction lines. The deviatoric stress reaches the yield point as evidenced by the uniformity, the saturation, and the temperature dependence of the deviatoric stress. Yield strengths, which correspond to the stress saturation level at a few per cent strain, are determined for NaCl and MgO up to 8 GPa and 1200°C. The results are consistent at room temperature with previous diamond anvil studies and demonstrate the effect of pressure on yield strength. These data demonstrate the feasibility of determining high pressure, high temperature yield strengths for mantle phases.