Yield analysis of large-scale adiabatic-quantum-flux-parametron logic: The effect of the distribution of the critical current

Abstract

We performed yield analysis of large-scale adiabatic-quantum-flux-parametron (AQFP) circuits using circuit simulations based on the Monte Carlo method assuming the distribution of the critical current of Josephson junctions. Based on the simulation results, we also made an analytical model for the circuit yield of large-scale AQFP circuits. The yield analysis indicates that AQFP integrated circuits containing 1 million gates can be realized when the interconnect inductance is about 40 pH and the normalized standard deviation of the critical current is less than 1%.