Abstract
The current transport and Josephson effect have been investigated in YBCO junctions, fabricated on the sapphire bicrystal substrates. The YBCO film with thickness t≅150 nm was deposited by dc sputtering on the epitaxial CeO 2 buffer layer made by rf magnetron sputtering. The junctions were characterized at dc and at mm waves. 5 μm wide junctions have moderately high normal state resistance R N = 5÷30 Ω with critical currents I c =50÷200 μA which give I c R N product of order of 0.5÷2 mV. The tolerance of characteristic interface resistance (R N S) was around 30% for the junctions on a chip. Experimental data, discussed in terms of d-wave symmetry, demonstrate possibility of design of small scale integrated Josephson microwave circuits.
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