Abstract
YBa2Cu3O7-δ (YBCO) thick films were prepared on Ni based alloys with an ion beam assisted deposited and textured yttria-stabilized zirconia (YSZ) buffer layer. Transport critical current densities (Jc) over 1×106 A/cm2 at 75 K, and over l×l07A/cm2at 4 K were obtained in the 1 µm thick YBCO films. Zero field critical current of 198 Amps at 75 K was obtained in a 2 µm thick and 1 cm wide YBCO film. Angular dependence measurement revealed Jc peaks for both H//c and H//a-b. The peak for H//c implies additional pinning due to defects such as small angle grain boundaries or twin boundaries. It was also found that the thick films on Ni based alloys were quite flexible.
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