Abstract
In recent years, there have been numerous efforts worldwide to develop the synchrotron X-ray scanning tunneling microscopy (SX-STM) technique. Here, the inauguration of XTIP, the world's first beamline fully dedicated to SX-STM, is reported. The XTIP beamline is located at Sector 4 of the Advanced Photon Source at Argonne National Laboratory. It features an insertion device that can provide left- or right-circular as well as horizontal- and vertical-linear polarization. XTIP delivers monochromatic soft X-rays of between 400 and 1900 eV focused into an environmental enclosure that houses the endstation instrument. This article discusses the beamline system design and its performance.
Highlights
For more than three decades, scanning probe microscopes have been an indispensable tool for the direct high-resolution study of surfaces
The emerging synchrotron X-ray scanning tunneling microscopy (SX-Scanning tunneling microscopy (STM)) technique combines the high spatial resolution of STM with the information obtained through X-ray/matter interaction
An optical chopper located between the spherical grating monochromator (SGM) and the exit inserted, it deflects the beam into the XTIP branch [Fig. 3(b)]
Summary
For more than three decades, scanning probe microscopes have been an indispensable tool for the direct high-resolution study of surfaces. The assembly provides a after the exit slit, the beamline uses horizontally deflecting vertical travel of Æ25 mm to allow for the selection of one of grazing-incidence elements, which allow a monochromator to two optical mirror coatings, carbon or platinum. Sector 4 (dfs: 39.15 m) that focuses the beam horizontally onto the includes a hard X-ray branch (4-ID-D) with the standard SGM entrance slit. An optical chopper located between the SGM and the exit inserted, it deflects the beam into the XTIP branch [Fig. 3(b)]. The vertical focusing mirror, M4 (dfs: 54.0 m), is a meridional elliptical cylinder and is the only vertically deflecting element in the beamline It images the source, originating from the center of the CPU, onto the sample position.
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