Abstract
X-SPEC is a high-flux spectroscopy beamline at the KIT (Karlsruhe Institute of Technology) Synchrotron for electron and X-ray spectroscopy featuring a wide photon energy range. The beamline is equipped with a permanent magnet undulator with two magnetic structures of different period lengths, a focusing variable-line-space plane-grating monochromator, a double-crystal monochromator and three Kirkpatrick-Baez mirror pairs. By selectively moving these elements in or out of the beam, X-SPEC is capable of covering an energy range from 70 eV up to 15 keV. The flux of the beamline is maximized by optimizing the magnetic design of the undulator, minimizing the number of optical elements and optimizing their parameters. The beam can be focused into two experimental stations while maintaining the same spot position throughout the entire energy range. The first experimental station is optimized for measuring solid samples under ultra-high-vacuum conditions, while the second experimental station allows in situ and operando studies under ambient conditions. Measurement techniques include X-ray absorption spectroscopy (XAS), extended X-ray absorption fine structure (EXAFS), photoelectron spectroscopy (PES) and hard X-ray PES (HAXPES), as well as X-ray emission spectroscopy (XES) and resonant inelastic X-ray scattering (RIXS).
Highlights
X-ray and electron spectroscopies are highly valuable techniques for material characterization, both in fundamental studies as well as for applied systems
In the past few years, soft X-ray absorption spectroscopy (XAS), X-ray emission spectroscopy (XES) and RIXS have been increasingly used for in situ and operando studies as well, which has been made possible by the development of specialized cells, where, typically, the ultra-highvacuum (UHV) environment of the analytics is separated from the sample under atmospheric conditions by an ultrathin membrane (Guo et al, 2002; Heske et al, 2003; Fuchs et al, 2008; Jiang et al, 2010; Nagasaka et al, 2010; Blum et al, 2009; Escudero et al, 2013; Weinhardt et al, 2013; Niwa et al, 2013; Schwanke et al, 2014; Benkert et al, 2014; Leon et al, 2019)
These experiments profit from the high sensitivity to the chemical and electronic structure of the soft X-ray spectroscopies and the accessibility of absorption edges of light elements, which are of particular importance for many applied questions
Summary
X-ray and electron spectroscopies are highly valuable techniques for material characterization, both in fundamental studies as well as for applied systems. In the past few years, soft XAS, XES and RIXS have been increasingly used for in situ and operando studies as well, which has been made possible by the development of specialized cells, where, typically, the ultra-highvacuum (UHV) environment of the analytics is separated from the sample under atmospheric conditions by an ultrathin membrane (Guo et al, 2002; Heske et al, 2003; Fuchs et al, 2008; Jiang et al, 2010; Nagasaka et al, 2010; Blum et al, 2009; Escudero et al, 2013; Weinhardt et al, 2013; Niwa et al, 2013; Schwanke et al, 2014; Benkert et al, 2014; Leon et al, 2019) These experiments profit from the high sensitivity to the chemical and electronic structure of the soft X-ray spectroscopies and the accessibility of absorption edges of light elements, which are of particular importance for many applied questions (e.g. in the fields of batteries, catalysis, and for organic materials). We will discuss the design considerations for X-SPEC and the resulting beamline layout, and give some examples demonstrating the performance of the beamline and its endstations
Sign-in/Register to view highlights & summary Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
