Abstract
ZnO thin films were deposited by successive ionic layer adsorption and reaction (SILAR) method using a zinc nitrate and ammonium bath on glass substrates. The number of employed cycles were 50, 100 and 200. The films were studied by X-ray diffraction (XRD), optical absorption (UV–Vis) and μ-Raman. Structural analysis by XRD shows that the as-deposited ZnO films have high-orientation along c-direction (002). The band gap energy decreases from 3.39 to 3.32eV with number of cycles. By μ-Raman spectroscopy, the principal vibration modes around 435, 550, 579, and 1100cm-1 were determined.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
