Abstract
Defects induced in Y3Al5O12 single crystals by swift heavy ions are investigated by X-ray diffraction (XRD) and atomic force microscopy. The irradiation was performed at GANIL with 561 MeV 51Cr, 466 MeV 128Te, and 957 MeV 208Pb ions. The XRD data reveal that the lattice strain increases with increasing electronic stopping power, whereas the hillock parameters (height and diameter) are not influenced by the electronic stopping power. According to our experimental data, for the same mean electronic stopping power, the hillock parameters are more pronounced for the lower range in contrast to swelling measurements. The experimental data show a strong increase in the hillock parameter at higher fluence, indicating the amorphization of Y3Al5O12 single crystals.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
