X-ray-induced mutation to 6-thioguanine resistance in cultured human diploid fibroblasts

Abstract

X-ray induced mutation to 6-thioguanine (6TG)-resistance was studied in early passage cultures of human diploid fibroblasts. The appearance of phenotypic induced mutants in irradiated cell populations was linearly related to the number of post-irradiation cell doublings and to the duration of the growth period prior to mutant selection; the maximum yield of X-ray induced mutants was observed when cells surviving radiation had completed 3–4 doublings (6–7 days growth_in non-selective medium. The maximum induced mutation frequency was linearly related to X-ray dose and the mutation rate was estimated to be 3.1 · 10 −7 mutations per viable cell per rad. The data obtained for X-ray induced mutations in cultured human diploid fibroblasts were compared with (a) similar experimental data obtained with established cell cultures and (b) theoretical predictions of X-ray mutation rates in human germ cells.