Abstract
Crystal Research and TechnologyVolume 53, Issue 11 1870020 Cover PictureFree Access X-Ray Topography: X-Ray Topography Characterization of the Bridgman-Grown Crystals of Zinc Germanium Phosphide (Crystal Research and Technology 11/2018) First published: 08 November 2018 https://doi.org/10.1002/crat.201870020AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinkedInRedditWechat Graphical Abstract X-ray image of the zinc germanium phosphide crystal obtained at the synchrotron radiation using the rocking topography technique. More details can be found in article number 1800154 by Alexander A. Kaloyan, Konstantin M. Podurets, and co-workers. Volume53, Issue11November 20181870020 RelatedInformation
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