Abstract
The internal microstructure of large melt-grown paraffin (n-eicosane, C20H42) single crystals was examined by the Lang x-ray diffraction projection topographic technique. Crystal selection was facilitated by use of an electro-optical system which permitted instantaneous display of Laue transmission x-ray diffraction patterns on a television monitor. The crystals were oriented and topographic diffraction planes were selected by the use of a standard (001) stereographic projection plotted from computed angles between crystallographic planes. A second electro-optical system which permitted direct viewing of the topographic images was use for rapid alignment of the Lang camera and ensured uniformly exposed topographs. X-ray topographs were obtained from crystals in the as-grown, plastically deformed, and γ-irradiated states. The results indicate that both plastic deformation and γ irradiation caused marked changes in the microstructure of the crystals, and that x-ray topography can be successfully exploited to determine such changes in hydrocarbon crystals.
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