Abstract
AbstractDeformation, introduced into niobium and tantalum specimens by wire drawing at room temperature, produced changes in the shape and position of X-ray diffraction peaks. The resultant peak profiles and locations of all available peaks were recorded using the Debye-Scherrer geometry on a modified dtffractometer with crystal monochromated Cu Kα radiation. The amount of deformation in the surface layers of both metals was found to saturate essentially after only 20% reduction in area. The measured decrease in the lattice parameters of either material was attributed to a residual surface stress; the average value for the deformed saturated state for both tantalum and niobium wires corresponded to an equivalent longitudinal tensile stress of 35 ± 5 kg/mm2. Integral breadth measurements revealed approximately equal X-ray particle sizes in the <100> and <110> directions; the minimum particle size for the micro structures of both metals was around 200 Å and occurred after the first few draws.
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