Abstract
Diamond like carbon (DLC) films were deposited at room temperature on Si (111) substrates by microwave electron cyclotron resonance (ECR) plasma chemical vapor deposition (CVD) process using plasma of methane diluted with argon gas. During deposition, dc self bias (− 25 V to − 200 V) on substrate was varied by application of RF power to the substrate. The influence of substrate bias on density of the deposited films was studied by X-ray reflectivity (XRR). The results from these measurements are further correlated with the results from UV and visible Raman spectroscopy. DLC film is modeled as a structure having three different layers such as low density surface, bulk and interface with the substrate. This three-layer model is used to fit the measured XRR data to evaluate the surface, interface and interlayer roughness, thickness and density of these films. The surface roughness obtained from XRR is correlated with the results from Atomic Force Microscopy (AFM) measurements. The observed results are explained based on the subplantation model for DLC film growth.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
