Abstract
An X-ray photoemission spectroscopy (XPS) study at different takeoff angles of the derivatized surface resulting after prolonged (2 h) exposure of hydrogen-terminated 1×1-reconstructed (100)-oriented silicon to liquid 1-octyne at 170 °C has been carried out. The experimental data may be interpreted assuming that: (1) the grafting occurs through the formation of Si–C bonds; (2) in the considered conditions, one π bond of the octyne has a large survival probability after the grafting; and (3) side reactions leading to Si–O–C or Si–C(O) moieties are also active.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
