Abstract
Tin sulfide (SnS) thin films were grown by single zone sulfurization process using sputtered tin layers. Metallic tin (Sn) layers were grown on molybdenum (Mo) coated soda-lime glass substrates by DC magnetron sputtering. The sputtered Sn layers along with sulfur flakes were kept in a graphite box and sulfurized using a closed single zone quartz tube furnace at different temperatures that vary in the range of 200–350 °C for a fixed sulfurization time of 2 h. The X-ray photoelectron spectroscopy studies on these layers revealed approximately stoichiometric ratio of Sn/S at a sulfurization temperature of 350 °C. The X-ray diffraction studies revealed the presence of secondary phases such as SnS2 and Sn2S3 at lower sulfurization temperatures that got suppressed with the rise of temperature. All the layers showed the (111) plane as preferential orientation with orthorhombic structure and its intensity increased with the increase of sulfurization temperature. The evaluated crystallite size of the layers was found to increase with the increase of sulfurization temperature.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
