Abstract
The combination of X-ray photoelectron spectroscopy (XPS) with secondary ion mass spectroscopy (SIMS) promises to provide a powerful new approach both to quantitative analysis of surface composition and to the elucidation of surface molecular structure. In this work, we have tested our ultrahigh vacuum XPS/SIMS system to characterize a variety of metal, alloy, and metal oxygen surfaces. We report on the examination of clean silver surfaces where ions of clusters up to Agn+ where n = 1 to 5 have been observed. Studies have also been carried out on iron/ruthenium catalyst surfaces and on clean indium foils exposed to controlled doses of oxygen. In general, we have tried to illustrate the advantages of this combined technique.
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