X-ray photoelectron spectroscopic study of the formation of Cu/Ni interface mediated by oxide phase

Abstract

Chemical properties of CuOx thin films deposited on Ni were investigated by X-ray photoelectron spectroscopy to understand the mechanism of interface formation between Cu nanoparticles and Ni layer. On annealing, the valence state of Cu transformed from a monovalent oxide state to a metallic state in a reducing atmosphere and to bivalent oxide state in an inert atmosphere. Additionally, Ni migrated toward the surface. However, CuOx thin films deposited on Cu scarcely showed such transformations in the valence state of Cu. These results suggest that the surface oxide of Ni layer mediates the reduction of the surface oxide of Cu nanoparticles.