Abstract
The hard X-ray photoacoustic spectrum of ZnO thin film has been obtained in the EXAFS (extended X-ray absorption fine structure) region using synchrotron radiation. It is shown that information on EXAFS is included in the X-ray photoacoustic signal intensity and phase spectra which reflect the heat production processes in ZnO thin film. However, the results showed that the increases and changes in the photoacoustic signal intensity were different from those of the photoacoustic signal phase in the EXAFS region.
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