X-ray Peak Profile Analysis and Microstructural Characterization of Solid State Sintered TiO2 doped ZnO Ceramics

Abstract

In the present work, ZnO doped with TiO2 (2, 4, 6, 8 and 10 wt%) is prepared by conventional solid state reaction method. We investigated the crystallite development in ZnO doped with different concentrations of TiO2 by X-ray peak broadening analysis. X-ray peak profile analysis was used to evaluate the crystallite size and lattice strain by the Williamson-Hall (W-H) method. All other relevant physical parameters such as strain, stress, and energy density values were also calculated using W-H method with different models namely uniform deformation model (UDM), uniform stress deformation model (USDM) and uniform deformation energy density model (UDEDM). The Surface morphology and elemental composition of the samples was characterized by Scanning Electron Microscope (SEM) with Energy Dispersive Spectra (EDS).