Abstract
A Geiger counter spectrometer, with crystal-reflected CuKα radiation, is used to determine the shapes and breadths of the X-ray diffraction profiles of filings from high purity (99.999 per cent) and electrolytic (99.6 per cent) silver. Because the filings recover rapidly at room temperature, the observations are made on specimens kept at− 30°C. From the Fourier coefficients and breadths of the diffraction profiles, particle size and strain values are calculated. Normal strain values are found and particle size values of the order of 200 Å are obtained. No experimental evidence is found for the presence of stacking faults in plastically deformed silver. Curves illustrating the rate of recovery (increase in intensity with time of a profile maximum) of two specimens filed under different conditions are given.
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