X-Ray Measurements of Faulting in α Cu-Ge Alloys

Abstract

The shifts of the (111) and (200) x-ray diffraction lines have been measured by both the centroid and the peak method. From these measurements the stacking fault probability α and the twinning fault probability β can be obtained on powdered samples prepared by filing. These results show a parabolic type of dependence of α with composition, whereas the stacking fault probability α obtained from previous measurements using the same technique on Cu-Zn and Ag-Cd alloys had a linear dependence with composition. By means of a simple argument the relative stacking fault energies for these alloys can be deduced and compared with those obtained on similar Cu-Ge alloys by Howie using thin-film electron microscopy and by Haasen and King using tensile tests.