X-Ray Measurement and Enhancement of SBUPF1 Plasma Focus Device in Different Ar Pressures and Operating Voltages

Abstract

In this paper, best condition of filling gas pressure and operating voltage for SBUPF1 plasma focus device to have maximum intensity of hard and soft X-ray emission has been reported. For time resolved X-ray detection, PIN detector and fast plastic Scintillator detector with appropriate filters have been used and for time integrated X-ray emission measurement, radiography films with appropriate filter masks have been used. Rogowski coil has been used for pinch detection. The highest hard X-ray emission has been observed at the pressure of 0.45 mbar of Argon and discharge voltage about 23.5 kV. The highest Soft X-ray emission has been observed at the pressure of 0.35 mbar of Argon and discharge voltage about 23.5 kV. For enhancement of hard X-ray emission intensity, lead disk was placed in copper anode tip and measurements were repeated. Results have shown that hard X-ray emission has been enhanced about 23% and soft X-ray emission has been enhanced about 33% with inserting a high atomic number metal disk like lead. Results from integral X-ray measurement have shown presence of dominant peaks in ranges 13.2–15, 21–21.9 and 23.4–24.3 keV with significant spectral components in the range of 0–50 keV. Pinch size has measured with pin hole camera and it is about 0.6 mm × 2.12 mm. Captured images with SBUPF1 have confirmed that it is a suitable source for introspective imaging with capability of showing very fine details.