Abstract

Some results obtained as part of a multilaboratory research project entitled `x-ray imaging optics' are presented, with emphasis on a new generation of optical components and systems designed to operate in the soft x-ray (SXR) region. Included are discussions of optical constants for various thin-film materials in the SXR region, SXR multilayers, SXR microscopes, x-ray telescopes, and metrological instrumentation for testing and characterizing SXR optical elements.

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