Abstract
X-ray excited photoelectron spectra (XPS) using monochromatized Al — Kα radiation (ℏω =1,486.7 eV) have been analysed quantitatively. The intensities of the various core lines (Li(1s), O(1s), O(2s), Nb(3s), Nb(3p), Nb(3d), Nb(4s), Nb(4p)) normalized to the intensity of the Nb (3d5/2)-line, show good agreement with those calculated with theoretical values for the photoabsorption cross section of the free atoms and the theoretical estimates of the dependance of the electron escape depth on the electron kinetic energy. From the energy loss spectra observed at the high binding energy side of the XPS core lines the energy loss function Im {−1/e(ω)} is calculated and compared to published optical data. This comparison yields directly the total electron escape depth as function of the electron energy over a large energy range.
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