Abstract
X-ray dynamic diffraction on the periodic distortions of a Si crystal surface in Laue geometry is investigated by means of the three-crystal X-ray diffractometry (TCD) method. Numerical calculations are made of the obtained TCD spectra. It is shown that diffracted wave intensity on the exit surface of the crystal under investigation and the TCD spectra are of periodic character. X-ray dynamic diffraction on the cylindrically bent single crystals with periodically deformed surfaces are also investigated both, theoretically and experimentally. The diffraction reflection curve (DRC) is obtained at different bending radii of the crystal. It is shown that in the case of bending the diffraction maxima are disappeared in TCD spectra when R > 0 (R is the bending radius of crystal under investigation) and bending in the opposite direction (R < 0) improves the contrast. [Russian text Ignored.]
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