Abstract
Four hundred and fourteen references concerning x-ray diffraction occurring in published literature from mid 1977 through late 1979 are cited in this review. The review places emphasis on new developments in applications and instrumentation in both single crystal and powder diffraction; however, the topic of crystal structure analysis has been ignored except in the area of new instrumentation. Compound analysis has also been omitted where emhasis was on the compound rather than the method. Some topics covered in the review are synchrotron radiation applications, x-ray sources, flash x-ray techniques, detectors, image intensifiers, double-crystal diffractometers, precision diffractometers, single-crystal devices, x-ray topography, computer automation, diffractometry, low-temperature diffractometry, high-temperature diffractometry, special-handling techniques or equipment, quantitative analysis, line profile theory, profile analysis, stress analysis, crystallographic texture, computer programs, powder pattern indexing, computer/search/match techniques, powder cameras, and powder pattern in general. (BLM)
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