Abstract
Epitaxial ultrathin iron oxide films of different thicknesses were grown by reactive molecular beam epitaxy in 10−6 mbar oxygen atmosphere on MgO(0 0 1) single crystal substrates at room temperature. Afterwards, the films were studied by x-ray diffraction, x-ray reflectivity and x-ray photoelectron spectroscopy to provide information regarding film structure as well as chemical composition of the films. Except for a very thin interface layer of subnanometre thickness, the iron oxide films have magnetite stoichiometry and structure and Mg does not diffuse from the substrate into the iron oxide film. The interface layer has a wuestite structure as determined by kinematic diffraction analysis. The magnetite films exhibit very homogeneous thickness while the vertical lattice constant decreases gradually towards its bulk value.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
