Abstract
Analytic expressions for the integrated intensities of reflexions from faulted close-packed structures have been obtained. These involve a single root of the characteristic equation (the root which corresponds to the reflexion under consideration), its coefficients and the initial conditions. The particular utility of the solution for cases where one or more roots of the characteristic equation have unit modulus is demonstrated.
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Schedule a callMore From: Acta Crystallographica Section A: Crystal Physics, Diffraction, Theoretical and General Crystallography
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