Abstract
The crystal perfection of a series of silica-alumina doped wires ranging from 38 mils to 2 mils in diameter has been studied by x-ray techniques. Undoped wire 10 mils in diameter has also been studied. A minimum crystallite size of approximately 300 A results from cold work. Strain values obtained by the Warren-Averbach analysis have been converted to dislocation densities. Suggestions are made for improvement of the technique.
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