X-Ray diffraction analysis by fluorescent X-ray apparatus

Abstract

An X-ray diffraction analysis was done by using a fluorescent X-ray apparatus without any modification. Pure metal was placed on the sample holder of fluorescent X-ray spectrometer, and the analysing crystal was substituted by the analytical specimen. The pure metal was bombarded by the X-rays from the X-ray tube, and the fluorescent X-rays produced were diffracted by the sample. The diffracted X-rays were detected by a scintillation counter. Copper plate as pure metal and calcium carbonate, calcium oxide and quartz as specimen were used in this experiment, and the detection limit was examined on the mixture of calcium carbonate and calcium fluoride. The limit of detection was about 10% for calcium carbonate.