Abstract
Electron probe microanalyses were performed on SnTe crystal grown by the Bridgman method doped with 1.8 wt% Gd. Scanning electron microscopic observations and electron probe microanalysis carried out on the (110) and (100) oriented samples revealed two types of precipitate enriched in gadolinium. It was suggested that the dominant type contained a mixture of Gd4Te7 phase and Te0.8Gd0.2 eutectic. The composition of the second precipitate type was found to be a eutectic enriched with gadolinium.
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