Abstract
Epitaxial single crystal thin films of Sr 1− x Ba x TiO 3 ( x = 0, 0.2 and 0.5) have been deposited on MgO (001), SrTiO 3 (001) and LaAlO 3 (012) substrates using pulsed laser deposition (PLD). The full width at half maximum (FWHM) of the X-ray rocking curves for the (002) reflection of the Sr 1− x Ba x TiO 3 were exceptionally narrow for films deposited on SrTiO 3 (140 s of arc) and LaAlO 3 (72 s of arc) despite a lattice mismatch ± 1% and 4% respectively. X-ray rocking curves for films deposited on MgO substrates were significantly broader (± 2500 arcsec). The data show that PLD can be used to grow films of MBE quality.
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