Abstract
A quantitative model, based on x-ray diffraction, is proposed to analyze the CuPt ordered III-V ternary semiconductor alloy films. The model takes into account the size distribution of the two different laminae-shaped variants, the random distribution of the anti-phase domain boundaries, and the atomic displacements due to the bond length difference between the two constitutive binary materials. The model enables us to extract quantitatively the structural information of the ordered films from the x-ray diffraction data.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.