Abstract
The X-ray linear attenuation coefficient of single-crystal silicon has been measured to within 0.5% using an energy dispersive method. Atomic photoelectric cross sections are derived from the experimental results and compared with theoretical calculations. Results are given for the Cu and Mo K lines.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of Physics B: Atomic and Molecular Physics
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
