Abstract
ABSTRACTThe structure, composition and strain in Ni/Ti multilayers are analyzed using x-ray diffraction theories. The repeat period of the multilayers used in this study ranges from 1.3 to 12.8 nm. The composition modulation is obtained by using a kinematical theory of x-ray diffraction. A sine wave for the shorter repeat period and a rectangular wave for the longer repeat period are predicted for the composition modulation. The strain within each atomic layer is found by iteratively fitting the experimental x-ray diffraction pattern with the simulated one from a dynamical theory of x-ray diffraction. The strain at the interface is tensile in Ni and compressive in Ti with a complete relaxation of the strain at a distance away from the interface.
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