Abstract
This chapter focuses on XR head mounted displays (HMDs), the XR operation process, and XR feature extraction and detection technologies. Details of the XR technologies applied in state-of-the-art devices (including HMDs) are introduced in this chapter. Among XR operations, the XR feature extraction and detection process is the most computation burdening as well as energy- and time-consuming procedure of the XR process. The most important XR feature extraction and detection schemes are introduced in this book, which include scale-invariant feature transform (SIFT), speeded-up robust feature (SURF), features from accelerated segment test (FAST), binary robust independent elementary features (BRIEF), oriented FAST and rotated BRIEF (ORB), and binary robust invariant scalable keypoints (BRISK) ( ). This chapter consists of the following sections:
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