XPS Study on the determination of binding energies in high-purity TiO2 nanoparticles

Abstract

This study focuses on the precise determination of the binding energies of high-purity TiO2 nano-particles, using X-ray photoelectron spectroscopy (XPS). TiO2, an essential ceramic in high-tech sectors such as electronics, aerospace and photocatalysis, was analyzed in its pure state (99.5%) directly as received from the supplier, without previous alterations. XPS spectra revealed typical bond energy peaks for Ti at 458.42 eV and 464.13 eV, corresponding to Ti2p3/2 and Ti2p1/2 levels respectively, with a difference of 5.71 eV, validating the expected electron structure for Ti in TiO2. Additionally, peaks were identified at 457.36 eV and 463.36 eV, attributable to Ti3+, present in a Ti3O5 phase, as confirmed by X-ray diffraction (XRD) analysis. The mid-height width (FWHM) of the main Ti4+ peaks, ranging from 1.08 to 1.87 eV, and 0.96 eV for the Ti3+ peaks, highlights the homogeneity and exceptional purity of the sample. These findings not only corroborate the high quality of TiO2, but also provide a crucial benchmark for the scientific community, facilitating de-tailed comparisons with other samples and encouraging the development of innovative processes and materials. This study underscores the value of the XPS technique in the characterization of advanced ceramic materials and sets a standard for future research.