XPS and XAES study of titania-silica mixed oxide system

Abstract

An XPS and XAES (X-ray exited Auger electron spectroscopy) investigation was carried out to elucidate the structure of TiO 2 -SiO 2 mixed oxide systems in the broad range of the component concentrations (3 wt % ≤TiO 2 ≥97 wt %). It is found that a homogeneous TiO 2 -SiO 2 solid solution exists at low TiO 2 concentrations (TiO 2 ≤10 wt %). At least two phases (silica-rich content and titania-rich content) coexist in the intermediate TiO 2 concentration range. At low SiO 2 concentrations (TiO 2 ≥85%), silicon forms titanium silicate coating TiO 2 particles