Abstract
X-Ray photoelectron spectroscopy (XPS) and Temperature-programmed Reduction (TPR) of 2%(Ru1/2-Sn1/2)/Al2O3 prepared by the microwave-assisted method have been studied. 2%(Ru1/2-Sn1/2)/Al2O3 have previously been evaluated as a catalyst in the reduction reaction of 4-nitrophenol. XPS and TPR studies of 2%(Ru1/2-Sn1/2)/Al2O3 was performed to confirm the metal state of Ru and Sn and reducibility of the sample, respectively. XPS data suggested that the formation of metal Ru(0) and Sn(0) in all samples. The XPS spectra of Ru 3p3/2 and Sn 3d5/2 shows binding energy peak at ∼ 461.0 ± 0.2 eV and ∼ 484,1 eV, respectively. The correlation of TPR and XPS characterization will be discussed further.
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