Year-end Sale % OFF 
Abstract
The interfacial chemistry of solvent cast films of block copolymers of poly(ethylene oxide) (PEO) and poly(lactic and glycolic acid) (PLGA) have been investigated over a wide range of compositions. X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectrometry (SSIMS) were utilized to provide both elemental and structural data. In all cases it is found that the PLGA component preferentially resides at the copolymer surface, and this is demonstrated by the use of the variable electron takeoff angle XPS. SSIMS confirms the low concentrations of PEO at the copolymer surface. Radical cation intensities within the SSIMS spectra have been correlated to PLGA block compositions. It is demonstrated that these ion intensities may be used to estimate the PLGA surface chain sequence composition and its short-range order.
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
