Abstract
The system V 2 O 5 TiO 2 anatase is an important industrial catalyst for the partial oxidation of hydrocarbons. Model catalysts were prepared by depositing thin V 2O 5 layers upon clean anatase single crystal minerals by means of DC magnetron sputtering. XPD measurements were performed on the fresh structure, recording the Ti 2 p 3 2 , V 2 p 3 2 , O 1s and C 1s photoemission lines at 28° polar angle. The scans displayed a marked degree of symmetry and structure, which was interpreted on the basis of the experimental anatase XPD pattern. After a standard catalytic reaction the used model catalysts were re-examined by a similar XPD characterization.
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