Abstract
In emerging nanotechnologies, due to the manufacturing process, a significant percentage of components may be faulty. In order to make systems based on unreliable nano-scale components reliable, it is necessary to design fault-tolerant architectures. This paper presents a novel fault-tolerant technique for nanocomputers, namely the XOR multiplexing technique. This hardware redundancy technique is based on a numerous duplication of faulty components. We analyze the error distributions of the XOR multiplexing unit and the error distributions of multiple stages of the XOR multiplexing system, then compare them to the NAND multiplexing unit and the NAND multiplexing multiple stages system, respectively. The simulation results show that XOR multiplexing is more reliable than NAND multiplexing. Bifurcation theory is used to analyze the fault-tolerant ability of the system and the results show that XOR multiplexing technique has a high fault-tolerant ability. Similarly to the NAND multiplexing technique, this fault-tolerant technique is a potentially effective fault tolerant technique for future nanoelectronics.
Highlights
System reliability has always been an issue of widespread concern, and reliable systems have been widely required by various applications [1,2,3,4,5,6,7,8]
The multiplexing technique has been studied as an effective fault-tolerant technique for protection against the increasing transient faults in nanoelectronic circuits [22,23,24,25]
In order to make systems based on unreliable nanoelectronics reliable, it is necessary to design fault-tolerant architectures
Summary
System reliability has always been an issue of widespread concern, and reliable systems have been widely required by various applications [1,2,3,4,5,6,7,8]. When N is extremely large, the probability of the number of stimulated outputs of the XOR multiplexing unit could approximately obey the normal distribution. To the XOR multiplexing unit, the probability of the number of stimulated outputs of the NAND multiplexing unit could be approximated to obey the normal distribution when N is extremely large. Distributions against the number of fault outputs are plotted in longer appropriately described by the normal distribution in terms of the cumulative distribution, As can be declined seen, withbundle the same gate error probability and inputmultiplexing, error level, when. Same input probability, error level, which the XOR multiplexing has a smaller mean value of error outputs, In other words, the multiplexing unit is more reliable than von Neumann’s multiplexing means the XOR multiplexing unit produces fewer faulty outputs than the NAND multiplexing unit.
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