Abstract
X-ray absorption near edge structure (XANES) and extended X-ray absorption fine structure (EXAFS) measurements have been done at the K-edge of Cu in Cu-Ti glasses and on the K-edges of Ni and Zr in Ni-Zr glasses using a synchrotron radiation source. The results are discussed in terms of the shape shift and intensity of the absorption edge as well as the principal absorption maximum. The values of bondlength calculated by the one-electron multiple scattering XANES theory as well as the graphical analysis EXAFS technique show good agreement.
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