Abstract
The XAFS spectra of CoCr films prepared at different substrate temperatures have been compared. The patterns of XANES and EXAFS of the films with high H c⊥ (1150 Oe) and low H c⊥ (200 Oe) were slightly different. On the assumption that CoCr films consist of Co- and Cr-rich phases, an EXAFS analysis of nearest-neighbour atoms was made for various possible fractional ratios of these phases; the reliability factor ( R-factor) was smaller for the two-phase model than for the one-phase model in the high H c⊥ films, and vice versa in the low H c⊥ films.
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