Abstract
Coherent X-ray diffractive imaging (CXDI) allows us to observe thick objects with a high spatial resolution, also providing us with unique structural information, i.e., electron density distribution and/or strain distribution. We have developed high-resolution diffractive imaging apparatus using the high-intensity X-ray beam focused by total reflection mirrors at SPring-8 and have demonstrated high-resolution plane-wave CXDI and scanning CXDI (i.e. X-ray ptychography). In addition, we have demonstrated element-specific X-ray ptychography using anomalous scattering around a specific element. In the near future, CXDI will become a promising tool for structure investigation in various fields including high-pressure science.
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