エネルギー分散型X線回折法を用いた集合組織高速マッピング装置の開発

Abstract

Texture mapping system with energy dispersive X-ray diffraction method has been newly developed. Total time of measurement was reduced more than half by the adoption of a fast data transmission interface. Some examples are demonstrated in order to show the performance of the system. This approach is suitable for the study of local inhomogeneities of texture, such as colonies, in polycrystalline materials. The system is based on the energy dispersive X-ray diffraction method, in which diffracted energy spectrum from a fixed-angle sample is measured instead of angular scanning. Figure 1 shows the schematic diagram of this system. 12 KW rotating X-ray source (RIGAKU Ru-200) with Cr anode was used in this study. The energy range of measurements should be determined by the expected d-values of the samples. In the case of steels, this range is from ca. 8 to 40 KeV with a fixed detector angle which was chosen from 30 to 50. Cu, MO and W anodes are not suitable because there exist K or L level emission peaks from these materials in this energy range. These peaks cause the increase of dead time of the measuring system and also interfere with the analysis of diffraction peaks. From this point of view, Cr, Fe and Co are the candidates for anode material because they do not have any specific emission peaks in this energy range. A