Abstract
X-rays investigations have been shown to reveal important information regarding material features and the formation mechanism of mesostructured materials. Small angle X-ray scattering (SAXS) analysis performed using a synchrotron source has been very important in the optimization of the organization of mesoporous coatings obtained by evaporation induced self-assembly (EISA). The interaction between X-rays and ordered mesoporous films has only recently been reported, and new knowledge has been developed to use this external radiation source to tune the local material properties. Here we discuss the recent developments in X-ray lithography combined with sol–gel synthesis to pattern mesostructured and hierarchical porous coatings including the ability to tailor functionalized surfaces.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
